Figure B.4: Cracking phenomenon: a) Original crack Positive charge deposition: b) V», 0 to —1875 to 0 volts, c) 0 to +2840 to 0 volts and d) after 2.5 hours Negative charge deposition: e) V* accidentally raised to +3300 V
Liu, Hua-Kuang · California inst of technology pasadena jet propulsion lab · Television systems · Image processing · Optical processing · Liquid crystals · Neural nets · Optimization · Real time · Computer architecture · Optical images · Microchannel plates · Fabry perot interferometers · Information retrieval · Computer applications · Associative processing · Correlation techniques · BIAS · Low frequency · Dynamic range · Light modulators · Holograms · Pulse frequency modulation · Optical properties · Spatial distribution · INPUT · Compression · Nonlinear systems
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