Inside Out Library · Explore

Computer-Aided Engineering of Semiconductor Integrated Circuits (1979)

Defense Technical Information Center · leaf 299

An illustration from Computer-Aided Engineering of Semiconductor Integrated Circuits, 1979, leaf 299
*n>.i*U«9 3mSi 1Y4X" … 013TMCC <IUCINK3> Equlpotentlal contours before the onset of punch through. Figure 4.3.9a The approximate location of the developing bulk channel Is shown. Equlpotentlal contours after the onset of punch through. The 4.3.9b location of the bulk channel Is shown. 4.3.9c Potential along the bulk…

Meindl, J D · Stanford univ ca integrated circuits lab · Computer aided design · Integrated circuits · Semiconductor devices · Computer applications · Doping · Engineering · Fabrication · Ion implantation · Low costs · Measurement · Military applications · Oxidation · Physical properties · Silicon · Thermal properties · Vapor deposition

Internet Archive · Defense Technical Information Center · Public domain (US government work). Free to use for anything.

More pictures from Computer-Aided Engineering of Semiconductor Integrated Circuits

More like this