Analysis of the Capability to Effectively Design Complementary Metal Oxide Semiconductor Integrated Circuits (1984)
Defense Technical Information Center · leaf 28
supply to be almost completely shorted. A large amount of current flows through this circuit which is why latch-up Can be potentially damaging to the CMOS circuit. Latch-up susceptibility can be reduced or even eliminated in CMOS circuits by careful layout of the CMOS circuits and by either…
McConkey,M L · Air force inst of tech wright-patterson afb oh school of engineering · Integrated circuits · Metal oxide semiconductors · Simulation · Computer aided design · Theses · Gates(circuits) · Cycles · Bulk materials · Viability · Logic circuits · Logic devices · Flow charting · Circuits · Libraries · Complementary metal oxide semiconductors · Arithmetic units
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